Tested for use
Modern mobile devices have a lot to contend with in daily use. Engineers at VAIO® have developed numerous test procedures coupled with appropriate standards. In addition to general application scenarios, exceptional situations are also tested.
Dust is one of the main causes of long-term performance deterioration in a mobile computer. Heat cannot be dissipated efficiently if dust accumulates around the fans and cooling elements. With our own test setup we already prevent performance losses from occurring due to dust accumulation during the development phase of a new device.
Falls can have fatal consequences for a portable computer. Internal breakage, loose connections and other shock-inducing failures are simulated using a special test setup and optimised based on the results. The high-quality materials also assume an important function here, namely the ability to ensure full stability at all times.
The radiation of electromagnetic pulses produced by devices is legally enshrined in every country. We at VAIO® have our own test room where we can calculate and optimise the precise radiation emanating from our devices. Here we use a 360° rotary plate to conduct tests in the lab for correct function and low radiation of integrated radio equipment such as the WLAN module.
Robustness during movement through vibration test in operating mode / non-operating mode / packaging mode.
Electronic devices are exposed to shocks and vibrations when travelling by train, car or plane. Vibrations have an effect on components even when switched off, in transit or in flight. Patterns of fundamental oscillation plus scenarios involving trains or lorries are measured on the test bench. And all this is done in every mode of operation – operating, switched off and packaging mode. The device is then disassembled and precisely measured.
Static electricity can damage a computer and can be similarly unpleasant for humans if little electric shocks occur during use. Various measures are therefore taken during the design phase at VAIO to ensure safe and comfortable use even when static electricity is present.
Opening and closing
The hinges are probably the most rigorously used part of a notebook. They are moved and overextended day in, day out and with varying amounts of force. Even the cables which supply the monitor with electricity and image data are bent and twisted with every display movement. These stresses and strains are simulated for several years of use in test runs in order to ensure the long-term operational safety of a VAIO® device.
Every fall or impact suffered by the device represents a shock for the technology. Even though solid-state drives are no longer sensitive to shocks, there are many more components that are rigorously tested and optimised for impact behaviour at VAIO®.
A notebook is your constant companion and meets many different surfaces over time. We strive to provide you with the best quality that is resistant to stress marks. During our abrasion tests we place a weight of three kilos on the notebook and drag the device across various surfaces.
Screen pressure test
The liquid crystal display is sensitive by nature. We conduct a variety of pressure tests to optimise the structure of the housing until optimum protection is offered in various different scenarios. Such scenarios involve hands, elbows, hard edges and tight pockets: we test worst-case scenarios with direct pressure. We strive to attain robustness and durability. The touchscreen of the VAIO® A12 also undergoes a scratch test with a sharp object.
Whether it be network connections, USB ports or other connection ports: daily use in itself causes stresses and strains. We test the durability of connectors and boards during our connection tests. Connection points on the exterior are applied with a defined tensile load in five directions.
* Quality tests are conducted under a specific environment based on VAIO standards. This product's quality test does not guarantee no damage or accident, and does not guarantee PC data